Fig. 1. Schematic diagram of angle of compatible EBSD device

Fig. 2. Stretching table of MTI Instruments^[33]

Fig. 3. Stretching device of Kammrath & Weiss^[34]

Fig. 4. Piezoelectric driven medium and low frequency tensile fatigue testing device^[39]

Fig. 5. Ultrasonic fatigue SEM system^[40]

Fig. 6. Deformation measurement of tensile samples^[43]. (a) Schematic diagram of sample deformation;

Fig. 7. Biaxial tensile device^[61]

Fig. 8. SEM-EBSD biaxial tensile device^[62]

Fig. 9. Tensile-torsional in-situ testing setup^[63]

Fig. 10. Tensile-bending in-situ testing setup^[64]

Fig. 11. In-situ heating method^[68]

Fig. 12. SEM/EBSD-compatible laser heating device^[73]. (a) Schematic diagram of heating device;

Fig. 13. In-situ heating device^[74]

Fig. 14. Heating device produced by Shimadzu Corporation, Japan^[75]

Fig. 15. Hybrid heating unit^[76]

Fig. 16. Schematic diagram of heating unit^[77]

Fig. 17. High-temperature in-situ testing setup^[80]

Fig. 18. Schematic diagram of internal structure of high-temperature heating module^[81]

Fig. 19. EBSD-compatible in-situ high-temperature stretching device^[82]

Fig. 20. SEM/EBSD in-situ low-temperature stretching device^[87]

Fig. 21. Temperature measurement method of in-situ SEM low-temperature stretching device^[88]

Fig. 22. In-situ variable temperature tensile loading device^[91]

Fig. 23. In-situ high-temperature tensile testing of failure mechanisms of nickel-based high-temperature alloys at different temperatures^[103]

Fig. 24. In-situ EBSD images of non-deformed high-temperature alloys^[110]. (a) EBSD sampling areas; (b), (c), and (d) are IPF, KAM, and GND density maps in xz plane, respevtively; (e), (f), and (g) are IPF, KAM, and GND density maps in xy plane

Fig. 25. In-situ EBSD observation of grain growth at different annealing temperatures^[113]

Fig. 26. SEM in-situ three-point bending different strain distribution with grain orientation superimposed^[119].

Fig. 27. In-situ tensile microstructure characterization of high entropy alloy^[120]. (a) EBSD plot of sample at 0% tensile strain; (b) SEM image of sample at 0% strain; (c) DIC plot of sample at 18% tensile strain; (d) SEM image of sample at 18% strain

Fig. 28. Physical picture of sample rod^[125]

Fig. 29. TEM in-situ tensile fatigue device^[131]

Fig. 30. Thermally actuated MEMS stretching device^[132]

Fig. 31. Electrostatically driven TEM in-situ testing setup^[135]

Fig. 32. Schematic diagram of electrostatically driven stretching device^[136]

Fig. 33. Schematic diagram of TEM in-situ resistance heater^[137]

Fig. 34. TEM high-temperature mechanical loading device^[143]

Fig. 35. TEM in-situ MEMS heating device^[144]

Fig. 36. Schematic diagram of TEM heating device^[145]. (a) MEMS heating device; (b) MEMS heating temperature distribution

Fig. 37. XRD in-situ tensile experimental setup^[168]

Fig. 38. Biaxial tensile device mounted on a synchrotron^[169]

Fig. 39. Biaxial tensile/compression and low circumference fatigue experimental setup^[170]

Fig. 40. Planar biaxial loading device^[171]

Fig. 41. XRD-compatible in-situ biaxial device^[172]

Fig. 42. In-situ XRD biaxial loading device^[173]

Fig. 43. Synchrotron radiation XRD in-situ ultra-high temperature tensile testing device^[174]

Fig. 44. Neutron in-situ measurement variable temperature uniaxial stretching device^[175]

Fig. 45. Variable temperature ambient chamber^[175]