Acta Optica Sinica, Volume. 43, Issue 21, 2114001(2023)

Critical Thickness of Indium Atom Self-Fitting Migration in InGaAs Well-Cluster Composite Structure

Qingnan Yu1、*, Zijian Liu1, Xinyu Wang1, Ke Li1, Ru Wang1, Xinyu Liu1, Yu Pan1, Hui Li1, and Jianwei Zhang2
Author Affiliations
  • 1Jiangsu Province Engineering Research Center of Integrated Circuit Reliability Technology and Testing System, Wuxi University, Wuxi 214105, Jiangsu , China
  • 2Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, Jilin , China
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    Qingnan Yu, Zijian Liu, Xinyu Wang, Ke Li, Ru Wang, Xinyu Liu, Yu Pan, Hui Li, Jianwei Zhang. Critical Thickness of Indium Atom Self-Fitting Migration in InGaAs Well-Cluster Composite Structure[J]. Acta Optica Sinica, 2023, 43(21): 2114001

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    Paper Information

    Category: Lasers and Laser Optics

    Received: May. 4, 2023

    Accepted: May. 31, 2023

    Published Online: Nov. 16, 2023

    The Author Email: Yu Qingnan (yuqingnan1@126.com)

    DOI:10.3788/AOS230909

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