Optics and Precision Engineering, Volume. 28, Issue 2, 315(2020)

Study on surface quality of polished optical materials with quasi-Brewster angle method

HU Chun-guang1,*... SUN Zhao-yang1, FANG Zi-xuan2, LIU Jun1, ZHANG Hao3 and FANG Feng-zhou1 |Show fewer author(s)
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    References(28)

    [1] [1] YUAN J L, LYU B H, HANG W, et al.. Review on the progress of ultra-precision machining technologies[J]. Frontiers of Mechanical Engineering, 2017, 12(2): 158-180.

    [2] [2] BLAINEAU P, ANDR D, LAHEURTE R, et al.. Subsurface mechanical damage during bound abrasive grinding of fused silica glass[J]. Applied Surface Science, 2015, 353: 764-773.

    [3] [3] WANG H R, CHEN H F, FU G L, et al.. Relationship between grinding process and the parameters of subsurface damage based on the image processing[J]. The International Journal of Advanced Manufacturing Technology, 2016, 83(9/10/11/12): 1707-1715.

    [4] [4] FANG F Z, XU F F. Recent advances in micro/nano-cutting: effect of tool edge and material properties[J]. Nanomanufacturing and Metrology, 2018, 1(1): 4-31.

    [5] [5] YIN J F, BAI Q, ZHANG B. Methods for detection of subsurface damage: a review[J]. Chinese Journal of Mechanical Engineering, 2018, 31: 41.

    [6] [6] FEIT M, RUBENCHIK A. Influence of subsurface cracks on laser-induced surface damage[J]. Proceedings of SPIE - the International Society for Optical Engineering, 2004, 5273: 264-273.

    [7] [7] CHENG J, CHEN M J, LIAO W, et al.. Influence of surface cracks on laser-induced damage resistance of brittle KH2PO4 crystal [J]. Optics Express, 2014, 22(23): 28740-28755.

    [8] [8] GAO X, FENG G Y, ZHAI L L, et al.. Effect of subsurface impurities of fused silica on laser-induced damage probability [J]. Optical Engineering, 2014, 53(2): 026101.

    [9] [9] BUDE J, CARR C W, MILLER P E, et al.. Particle damage sources for fused silica optics and their mitigation on high energy laser systems[J]. Optics Express, 2017, 25(10): 11414-11435.

    [10] [10] NAUPORT J, AMBARD C, BERCEGOL H, et al.. Optimizing fused silica polishing processes for 351 nm high power laser application[C].Boulder Damage Symposium XL Annual Symposium on Optical Materials for High Power Lasers. Proc SPIE 7132, Laser-Induced Damage in Optical Materials: 2008, Boulder, Colorado, USA, 2008: 71321I.

    [11] [11] WU H Z, ROBERTS S G, MBUS G, et al.. Subsurface damage analysis by TEM and 3D FIB crack mapping in alumina and alumina/5vol.%SiC nanocomposites[J]. Acta Materialia, 2003, 51(1): 149-163.

    [14] [14] NEAUPORT J, AMBARD C, CORMONT P, et al.. Subsurface damage measurement of ground fused silica parts by HF etching techniques [J]. Optics Express, 2009, 17(22): 20448-20456.

    [15] [15] BERTUSSI B, CORMONT P, PALMIER S, et al.. Initiation of laser induced damage sites in fused silica optical components[J]. Optics Express, 2009, 17(14): 11469-11479.

    [16] [16] WU X P, GAO W R, HE Y, et al.. Quantitative measurement of subsurface damage with self-referenced spectral domain optical coherence tomography [J]. Optical Materials Express, 2017, 7(11): 3919-3933.

    [17] [17] EVANS C J, PAUL E, DORNFELD D, et al.. Material removal mechanisms in lapping and polishing[J]. CIRP Annals, 2003, 52(2): 611-633.

    [18] [18] PAL R K, GARG H, KARAR V. Material removal characteristics of full aperture optical polishing process[J]. Machining Science and Technology, 2017, 21(4): 493-525.

    [19] [19] LIAO W L, DAI Y F, LIU Z Z, et al.. Detailed subsurface damage measurement and efficient damage-free fabrication of fused silica optics assisted by ion beam sputtering[J]. Optics Express, 2016, 24(4): 4247-4257.

    [20] [20] WANG J, MAIER R L. Surface assessment of CaF2 deep-ultraviolet and vacuum-ultraviolet optical components by the quasi-Brewster angle technique[J]. Applied Optics, 2006, 45(22): 5621-5628.

    [21] [21] MA B, SHEN Z X, HE P F, et al.. Subsurface quality of polished SiO2 surface evaluated by quasi-Brewster angle technique[J]. Optik, 2011, 122(16): 1418-1422.

    [22] [22] ELFALLAGH F, INKSON B J. 3D analysis of crack morphologies in silicate glass using FIB tomography[J]. Journal of the European Ceramic Society, 2009, 29(1): 47-52.

    [23] [23] WU H Z, ROBERTS S G, MBUS G, et al.. Subsurface damage analysis by TEM and 3D FIB crack mapping in alumina and alumina/5vol.% SiC nanocomposites[J]. Acta Materialia, 2003, 51(1): 149-163.

    [24] [24] MENAPACE J A, DAVIS P J, STEELE W A, et al.. MRF applications: measurement of process-dependent subsurface damage in optical materials using the MRF wedge technique[C]. Laser-Induced Damage in Optical Materials: 2005. International Society for Optics and Photonics, 2006, 5991: 599103.

    [25] [25] YIN J F, BAI Q, ZHANG B. Methods for detection of subsurface damage: a review[J]. Chinese Journal of Mechanical Engineering, 2018, 31: 41.

    [26] [26] LEE Y. Evaluating subsurface damage in optical glasses[J]. Journal of the European Optical Society Rapid Publications, 2011, 6: 11001.

    [27] [27] WANG J, MAIER R L, BRUNING J H. Surface characterization of optically polished CaF2 crystal by quasi-Brewster-angle technique[C]. Optical Science and Technology, SPIE′s 48th Annual Meeting. Proc SPIE 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, San Diego, California, USA, 2003: 106-114.

    [28] [28] WANG J, VANKERKHOVE S, SCHREIBER H. Evaluation of coated and uncoated CaF2 optics by variable angle spectroscopic ellipsometry[J]. Thin Solid Films, 2011, 519(9): 2881-2884.

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    HU Chun-guang, SUN Zhao-yang, FANG Zi-xuan, LIU Jun, ZHANG Hao, FANG Feng-zhou. Study on surface quality of polished optical materials with quasi-Brewster angle method[J]. Optics and Precision Engineering, 2020, 28(2): 315

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    Paper Information

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    Received: Aug. 13, 2019

    Accepted: --

    Published Online: May. 27, 2020

    The Author Email: Chun-guang HU (cghu@tju.edu.cn)

    DOI:10.3788/ope.20202802.0315

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