Infrared and Laser Engineering, Volume. 45, Issue 4, 404003(2016)

Aliasing effect of sampled infrared imaging system

Shi Haoran1,*... Li Zhaolong1, Shen Tongsheng2 and Lou Shuli3 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    References(8)

    [1] [1] Nao Sheng Qiao, Chun Mei Yao. Study of sampling in CCD photoelectric imaging system[J]. Applied Mechanics and Materials, 2012, 220-223: 2087-2090.

    [2] [2] Grundland M, Patera J, Zuzana MAS'AK-OV'A. Image sampling with quasicrystals[J]. SIGMA, 2009, 75(5): 1-23.

    [5] [5] Wang Changwei, Jiang Yuesong, Liu Li, et al. Research on detector sampling of optical synthetic aperture imaging system[J]. Journal of Optoelectronics·Laser, 2010, 21(3): 424-429. (in Chinese)

    [6] [6] William K Pratt. Digital Image Processing[M]. 4th ed. Beijing: China Machine Press, 2009: 75-85. (in Chinese)

    [7] [7] Luke Scott, John D′Agostino. NVEOD FLIR92 thermal imaging systems performance model[C]//SPIE Aerospace Sensing Symposium, 1992, 1689(13): 194-203.

    [8] [8] Zhang Jianqi, Wang Xiaorui. Modeling of Optical Imaging System and Performance Evaluation Theory[M]. Xi′an: Xidian University Press, 2010. (in Chinese)

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    Shi Haoran, Li Zhaolong, Shen Tongsheng, Lou Shuli. Aliasing effect of sampled infrared imaging system[J]. Infrared and Laser Engineering, 2016, 45(4): 404003

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    Paper Information

    Category: 红外技术及应用

    Received: Aug. 10, 2015

    Accepted: Sep. 11, 2015

    Published Online: May. 11, 2016

    The Author Email: Haoran Shi (naroahux@163.com)

    DOI:10.3788/irla201645.0404003

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