Laser & Optoelectronics Progress, Volume. 57, Issue 12, 121008(2020)

A Periodic Structural Parameter Inspection Method Based on Spectrum Characteristics

Bin Song, Ning Yan, Linlin Zhu, and Xiaodong Zhang*
Author Affiliations
  • State Key Laboratory of Precision Measuring Technology & Instruments, School of Precision Instruments and Optoelectronics Engineering, Tianjin University, Tianjin 300072, China
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    Figures & Tables(15)
    Typical periodic texture image and spectrum characteristic. (a) Fabric image; (b) 3D spectrum with a series of characteristic peaks
    Simulation texture image and spectrum characteristic. (a) Simulation texture image; (b) 3D spectrum; (c) transverse spectrum and characteristic peaks
    Simulation results of texture image with uniformity error and spectrum characteristic. (a) Simulation texture image; (b) 3D spectrum; (c) transverse spectrum characteristic peaks and peak diffusion
    Correlativity between inspected uniformity error and preseted uniformity error
    Analysis of the relationship between the texture inclination α and the rotation angle of spectrum characteristic point β. (a) Decomposition diagram of d; (b) spectrum characteristic analysis
    User interface in the static density test software. (a) Texture image to be detected; (b) 2D spectrum and feature marker; (c) rotation-corrected image; (d) feature marker in the corrected image; (e) control of execution and output texture detection results
    Histogram analysis of error of measurement results. (a)Data measured by proposed method; (b) data measured by the method in Ref. [20]
    Real-time acquisition and inspection system. (a) Structure of acquisition system; (b) display interface of inspection result
    Fabric uniformity inspection results. (a)~(d) Fabric of uniform texture; (e)~(h) fabric stretched along transverse direction
    Paper counts based on spectrum characteristics. (a) Cross-section image of paper; (b) preprocessing image; (c) 3D spectrum; (d) spectrum characteristics
    Wood texture inspection based on spectrum characteristics. (a) Wood texture image; (b) preprocessing image; (c) 3D spectrum; (d) spectrum characteristics
    Inspection of microstructural arrays based on spectrum characteristics. (a)Texture image of microstructural arrays; (b) preprocessing image; (c) 3D spectrum; (d) spectrum characteristics
    • Table 1. Statistical results of measurement errors by different optimization methods

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      Table 1. Statistical results of measurement errors by different optimization methods

      MethodsSplineCubicBilinearPolyfit
      Maximum error /%0.270.320.500.51
      Median error /%0.100.150.200.20
      Average error /%0.150.170.250.26
    • Table 2. Density measurement results by proposed method

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      Table 2. Density measurement results by proposed method

      No.P1Error /%P2Error /%
      ManualAutomaticManualAutomatic
      186.185.91.399.699.20.6
      268.568.00.771.871.51.1
      379.680.00.587.588.20.6
      478.678.50.887.186.50.1
      581.381.10.488.588.20.6
      686.587.10.677.577.90.6
      787.486.90.584.384.00.4
      885.585.70.684.084.51.2
      967.567.80.763.664.00.6
      1083.383.50.473.973.41.2
      1184.984.71.179.078.41.3
      1284.685.00.575.876.00.3
      1378.679.00.581.682.10.5
      1469.169.81.370.470.00.6
      1575.876.20.382.482.20.5
    • Table 3. Density measurement results in Ref. [20]

      View table

      Table 3. Density measurement results in Ref. [20]

      No.P1Error /%P2Error /%
      ManualAutomaticManualAutomatic
      135.034.61.1446.546.10.86
      242.041.51.1955.055.40.73
      382.583.00.6193.592.21.39
      455.055.40.7361.562.31.30
      559.059.91.5382.083.01.22
      658.057.70.5293.092.30.75
      744.543.81.5782.583.00.61
      857.057.40.7079.579.60.31
      959.560.00.8497.096.90.10
      1082.583.00.6188.087.70.34
      1160.059.90.17101.0101.50.50
      1259.559.20.5096.095.80.21
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    Bin Song, Ning Yan, Linlin Zhu, Xiaodong Zhang. A Periodic Structural Parameter Inspection Method Based on Spectrum Characteristics[J]. Laser & Optoelectronics Progress, 2020, 57(12): 121008

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    Paper Information

    Category: Image Processing

    Received: Sep. 24, 2019

    Accepted: Oct. 30, 2019

    Published Online: Jun. 3, 2020

    The Author Email: Zhang Xiaodong (zhangxd@tju.edu.cn)

    DOI:10.3788/LOP57.121008

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