Opto-Electronic Engineering, Volume. 31, Issue 8, 41(2004)

Design of a pulse laser spectrum testing system

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    References(3)

    [1] [1] Kane D.M, Willis A P. Frequency noise spectroscopy lineshape measurements and simulations for a semiconductor laser with strong optical feedback [J]. Optics Communications, 1999, 166: 219-228.

    [2] [2] Jütte M, von der Osten W, Stolz H. Characterization of picosecond laser pulses by a bandwidth-limited time-resolved spectrum [J]. Optics Communications,1998, 157: 173-176.

    [3] [3] Acquaviva S, Caricato A P, Luches A, et al. Spectroscopic studies during pulsed laser ablation deposition of C-N films. [J]. Applied Surface Science, 1997, 109-110: 408-412.

    CLP Journals

    [1] LI Ding, LI Qian-tao, XIONG Chang-xin. Changing Rules of Deposition Rate with Time in Ion Beam Sputtering System[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2020, 18(6): 86

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Design of a pulse laser spectrum testing system[J]. Opto-Electronic Engineering, 2004, 31(8): 41

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    Paper Information

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    Received: Aug. 18, 2003

    Accepted: --

    Published Online: Nov. 14, 2007

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