Theoretical and Experimental Analysis for Measuring the Refractive Index and Thickness of a Film in a Leakage Waveguide

[in Chinese]; [in Chinese]; [in Chinese]

Acta Photonica Sinica, Volume. 34, Issue 4, 586(2005)

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References(3)

[3] [3] Ulrich R,Torge R. Measurement of thin film parameters with a prism coupler. Applied Optics, 1973,12(12) :2901 ～ 2908

[5] [5] Lu J,He S L,Romanov V G. Study of the leakage loss in a silica-on-silicon slab waveguide. Fiber Integrated Opt, 2003,22(4): 249～261

[7] [7] Lee J,Henry C H,Orlowsky K J, et al. Kometani Refractiveindex dispersion of phosphosilicate glass, thermal oxide, and silicon nitride films. Appl Opt, 1988 , 27 (19) : 4104～4107

CLP Journals

[1] ZHANG Jiang-tao, GU Zheng-tian, DENG Chuan-lu. Traditional Approximate Theory and Thin Film Optical Theory in SPR[J]. Acta Photonica Sinica, 2010, 39(7): 1216

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[in Chinese], [in Chinese], [in Chinese]. Theoretical and Experimental Analysis for Measuring the Refractive Index and Thickness of a Film in a Leakage Waveguide[J]. Acta Photonica Sinica, 2005, 34(4): 586

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