Infrared and Laser Engineering, Volume. 48, Issue 10, 1017002(2019)

In situ temperature programmed desorption of Ⅲ-nitride photocathode

Cheng Wei1,2, Shi Feng1,2, Yang Shuning1,2, Zhou Yujian1,2, and Ren Bin1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(8)

    [1] [1] Ren Bin, Shi Feng, Guo Hui, et al. First principles study on NEA GaN photocathode[J]. Infrared and Laser Engineering, 2015, 44(9): 2752-2756. (in Chinese)

    [2] [2] Wang Shurong, Qu Yi, Li Futian. Study of atmospheric background and target chareacteristic in ultraviolet band[J]. Infrared and Laser Engineering, 2007, 36(s2): 433-435. (in Chinese)

    [3] [3] Dyer J S, Benson R C, Phillips T E, et al. Outgassing analyses performed during vacuum bakeout of components painted with Chemglaze Z306/9922[C]//SPIE, 1992: 177-194.

    [4] [4] Xie Yuntao, Zhang Yujun, Wang Xi, et al. Research on the gain saturation effect of an image intensifier based on microchannel plate [J]. Infrared and Laser Engineering, 2017, 46(10): 1003005. (in Chinese)

    [5] [5] Ren Bin, Shi Feng, Guo Hui, et al. Cs, O adsorption for forming GaAs photocathodes[J]. Infrared and Laser Engineering, 2016, 45(8): 0821001. (in Chinese)

    [6] [6] Liu Dafu, Huang Yangcheng, Wu Ligang, et al. Property analysis of window sorbate of infrared detector working at ultralow temperature in ultravacuum [J]. Infrared and Laser Engineering, 2005, 34(1): 11-14. (in Chinese)

    [7] [7] Ho Y M, Parks H G, Vermeire B. A model for outgassing of organic contamination from wafer carrier boxes[C]// Advanced Semiconductor Manufacturing 2002 IEEE/SEMI Conference and Workshop. IEEE, 2002: 314-318.

    [8] [8] Wang Li, Sun Lichen, Yan Rongxin, et al. Outgassing analysis of testing products in unltra-high vacuum[J] Spacecraft Environment Engineering, 2010, 27(6): 735-738.

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    Cheng Wei, Shi Feng, Yang Shuning, Zhou Yujian, Ren Bin. In situ temperature programmed desorption of Ⅲ-nitride photocathode[J]. Infrared and Laser Engineering, 2019, 48(10): 1017002

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    Paper Information

    Category: Materials and Thin films

    Received: Jun. 8, 2019

    Accepted: Jul. 14, 2019

    Published Online: Nov. 19, 2019

    The Author Email:

    DOI:10.3788/irla201948.1017002

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