Acta Optica Sinica, Volume. 42, Issue 9, 0908001(2022)

High-Temperature Material Spectral Emissivity Measurement Technology Based on 800 mm Semi-Ellipsoidal Reflector

Yongxing Yang1,2、*, Xinrui Wang1,2, Beibei Chen1,2, Hengrui Guan1,2, Jinpeng Li1,2,3、**, Jingyuan Zhang1,2, Xinhua Lai4, and Jinbiao Zhao3
Author Affiliations
  • 1University of Science and Technology of China, Hefei 230022, Anhui, China
  • 2Nanjing Research Center of Astronomical Instruments, University of Science and Technology of China, Nanjing 210042, Jiangsu, China
  • 3Nanjing Astronomical Instruments Co., Ltd., Chinese Academy of Sciences, Nanjing 210042, Jiangsu, China
  • 4Mathematics and Science College of Shanghai Normal University, Shanghai 200234
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    Figures & Tables(13)
    Layout of measuring devices. (a) Devices for measuring spectral emissivity of high-temperature materials; (b) 800 nm semi-ellipsoidal mirror
    Simulated ray-tracing diagrams. (a) 30°reflectivity measurement mode; (b) 60°reflectivity measurement mode; (c) 90°reflectivity measurement mode; (d) normal transmittance measurement mode
    Simulation result curves. (a) 30° reflectivity measurement curves; (b) 60° reflectivity measurement error curves; (c) 90° reflectivity measurement curves; (d) 30° reflectivity measurement error curves; (e) 60° reflectivity measurement curves; (f) 90° reflectivity measurement error curves
    90° normal transmittance curves. (a) Measured value curves; (b) standard value curves
    Transmittance error curves of AlN
    Spectral emissivity and reflectivity of super black alloy material. (a) Emissivity; (b) reflectivity
    Actual measurement result curves. (a) Spectral emissivity curves of grass green sample; (b) spectral reflectivity curves of grass green sample; (c) relationship between transmittance of translucent material and wavelength; (d) standard deviation diagram of transmittance of translucent material
    Measurement results for alloy material. (a) Emissivity; (b) reflectivity
    Physical diagrams of alloy material. (a) Physical diagram of alloy material at medium-low temperature; (b) physical diagram of alloy material at high temperature
    Three-dimensional ray-tracing model diagrams. (a) Wireframe diagram of model; (b) physical diagram of model
    Two-dimensional irradiance distributions. (a) Irradiance distribution without structural factors; (b) irradiance distribution with structural factors
    • Table 1. Parameters of semi-ellipsoidal mirror

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      Table 1. Parameters of semi-ellipsoidal mirror

      ParameterDescription
      Length of ellipsoid major axis /mm800
      Length of ellipsoid minor axis /mm690
      Focal length /mm404.8
      Ellipsoid equationx24002+z2+y23452=1
      MaterialAluminum 7075
      Surface accuracy≤3λ@0.6328 μm
    • Table 2. Parameters of Ray tracing

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      Table 2. Parameters of Ray tracing

      Model typeDescription
      Semi-ellipsoidal mirrorinner surfaceGold-plated film;reflectivity: 98.3%;ABg model: A=0.0001,B=0.0150, g=2
      Light source settingEmission type: blackbody;number of rays: 100000;angular distribution: Lambertian;temperature: 1000 K
      Off-axis mirrorGold-plated film;reflectivity: 99.9%;wavelength: 2--14 μm
      Sample surface modelSpecular/diffuse reflection
      Infrared spectrometerReceiving surface is setas a perfect absorber witha radius of 80 mm
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    Yongxing Yang, Xinrui Wang, Beibei Chen, Hengrui Guan, Jinpeng Li, Jingyuan Zhang, Xinhua Lai, Jinbiao Zhao. High-Temperature Material Spectral Emissivity Measurement Technology Based on 800 mm Semi-Ellipsoidal Reflector[J]. Acta Optica Sinica, 2022, 42(9): 0908001

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    Paper Information

    Category: Geometric Optics

    Received: Oct. 19, 2021

    Accepted: Dec. 6, 2021

    Published Online: May. 6, 2022

    The Author Email: Yang Yongxing (nameyyan@mail.ustc.edu.cn), Li Jinpeng (lijinpeng@nairc.ac.cn)

    DOI:10.3788/AOS202242.0908001

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