Chinese Physics B, Volume. 29, Issue 8, (2020)
Ultra-low thermal conductivity of roughened silicon nanowires: Role of phonon-surface bond order imperfection scattering
Fig. 1. Schematic illustration of surface roughness profile of SiNWs, where
Fig. 2. Thermal conductivity of smooth and roughened SiNWs at different temperature. The solid lines present our calculations. The symbols represent experimental measurements from Ref. [
Fig. 3. Phonon scattering rates in smooth SiNW (a) and roughened SiNW (b) as functions of phonon angular frequency.
Fig. 4. Contour plots of thermal conductivity as a function of
Fig. 5. (a) Power spectrum density of exponential surface and Gaussian surface. (b) Rough surface profiles generated from exponential and Gaussian ACFs.
Fig. 6. Thermal conductivity as a function of parameters (a) diameter, (b) rms of roughness, (c) correlation length of roughness, and (d) surface-to-volume ratio.
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Heng-Yu Yang, Ya-Li Chen, Wu-Xing Zhou, Guo-Feng Xie, Ning Xu. Ultra-low thermal conductivity of roughened silicon nanowires: Role of phonon-surface bond order imperfection scattering[J]. Chinese Physics B, 2020, 29(8):
Received: Mar. 31, 2020
Accepted: --
Published Online: Apr. 29, 2021
The Author Email: Xie Guo-Feng (nxu@ycit.c)