Infrared and Laser Engineering, Volume. 48, Issue 9, 919003(2019)
Measurement of minority carrier lifetime in silicon by high speed terahertz detector
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Zhang Zhao, Chen Xieyu, Tian Zhen. Measurement of minority carrier lifetime in silicon by high speed terahertz detector[J]. Infrared and Laser Engineering, 2019, 48(9): 919003
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Received: May. 5, 2019
Accepted: Jun. 3, 2019
Published Online: Oct. 12, 2019
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