Infrared and Laser Engineering, Volume. 51, Issue 3, 20210443(2022)

Trajectory optimization method of variable pitch spiral matrix for intermediate frequency error

Hang Yang1, Ying Chen1, Wen Huang2, Ming Han1, Xingxing Zhang1, Yang Jia3, Bin Li1, and Rong Jiang1
Author Affiliations
  • 1School of Engineering, Zunyi Normal University, Zunyi 563006, China
  • 2Institute of Mechanical Manufacturing Technology, China Academy of Engineering Physics, Mianyang 621900, China
  • 3Wuhan National Laboratory of Optoelectronics, Huazhong Institute of Optoelectronics Technology, Wuhan 430073, China
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    Figures & Tables(13)
    Initial surface error distribution
    (a) 3D and (b) 2D shapes of magnetorheological finishing removing function
    Spiral trajectory
    Initial surface
    Spiral polishing rear shape
    PSD analysis of the (a) x direction and (b) y direction before and after the spiral polishing
    Grating trajectory
    Initial surface
    Raster line processing rear shape
    PSD analysis in the (a) x direction and (b) y direction before and after the grating line polishing
    (a) Before and (b) after polishing with raised spiral matrix trajectory processing
    PSD analysis of the width screw matrix trajectory (a) x direction (b) y direction PSD analysis
    • Table 1. Comparison before and after PSD optimized

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      Table 1. Comparison before and after PSD optimized

      DirectionKey frequency PSD before optimized After polishingImprovement
      RasterSpiralNew method
      PSDConverging efficiencyPSDConverging efficiencyPSDConverging efficiency
      x9.43E-059735136186%127887%112588%2.00%
      y9.43E-05829281672%78435%0.00001893100%96.54%
      x1.29E-038888115287%123586%394.696%8.99%
      y1.29E-0396.441.34E-05100%0.00001064100%1.1299%−1.16%
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    Hang Yang, Ying Chen, Wen Huang, Ming Han, Xingxing Zhang, Yang Jia, Bin Li, Rong Jiang. Trajectory optimization method of variable pitch spiral matrix for intermediate frequency error[J]. Infrared and Laser Engineering, 2022, 51(3): 20210443

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    Paper Information

    Category: Photoelectric measurement

    Received: Jul. 2, 2021

    Accepted: --

    Published Online: Apr. 8, 2022

    The Author Email:

    DOI:10.3788/IRLA20210443

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