Opto-Electronic Engineering, Volume. 32, Issue 6, 79(2005)
[in Chinese]
[3] [3] ZHANG Lei, BAO Paul. Edge detection by scale multiplication in wavelet domain [J]. Pattern recognition letters,2002,23:1771-1784.
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[in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(6): 79