Optics and Precision Engineering, Volume. 17, Issue 2, 274(2009)

Unfolded study on spectra by elliptical crystal spectrometer

WANG Rui-rong1,2、* and CHEN Wei-min1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(8)

    [1] [1] MATTHEWS D L, CAMPBELL E M, CEGLIO N M, et al.. Characterization of laser-produced plasma X-ray sources for use in X-ray radiograph [J]. J. Appl phys., 1983, 54(8):4260-4268.

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    [5] [5] WANG R R, WANG W, WANG CH, et al.. Spectral characterization of double-driven X-ray laser plasmas[J]. Acta Phys. Sin.,2003,52(3):556-560. (in Chinese)

    [6] [6] JANESICK J R , ELLIOT T , MARSH H H , et al.. Potential of CCDs for UV and X-ray diagnostics [J]. Rev. Sci. Instrum.,1985,56(5):796-801.

    [7] [7] GLFRICH J V, BROWN D B, BURKHALTER P G. Integral reflection coefficient of X-ray spectrometer crystals[J]. Appl Spectrosc,1975,29(4):322-326.

    [8] [8] HENKE B L,YAMADA H T,TANAKA T J. Pulsed plasma source spectrometry in the 80-8 000-ev X-ray region[J]. Rev. Sci. Instrum.,1983,54(10):1311-1330

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    [2] SHI Jun, PENG Diyong, XIAO Shali. Analysis and Implementation of Toroidally Bent Crystal for X-ray Imaging Technology[J]. Opto-Electronic Engineering, 2015, 42(9): 66

    [3] WANG Rui-rong, CHEN Wei-min, WANG Wei. Improvement of spectral resolution power for an elliptically curved crystal spectrometer[J]. Optics and Precision Engineering, 2010, 18(6): 1303

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    WANG Rui-rong, CHEN Wei-min. Unfolded study on spectra by elliptical crystal spectrometer[J]. Optics and Precision Engineering, 2009, 17(2): 274

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    Paper Information

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    Received: Jan. 7, 2008

    Accepted: --

    Published Online: Oct. 9, 2009

    The Author Email: Rui-rong WANG (Wangrr59@citiz.net)

    DOI:

    CSTR:32186.14.

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