Electro-Optic Technology Application, Volume. 24, Issue 5, 27(2009)

Several Scanning Probe Microscopy Characterization Techniques on Nanomaterials

CHU Hong-xiang
Author Affiliations
  • [in Chinese]
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    References(12)

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    CHU Hong-xiang. Several Scanning Probe Microscopy Characterization Techniques on Nanomaterials[J]. Electro-Optic Technology Application, 2009, 24(5): 27

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    Paper Information

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    Received: Jul. 18, 2009

    Accepted: --

    Published Online: Dec. 30, 2009

    The Author Email:

    DOI:

    CSTR:32186.14.

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