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Optics and Precision Engineering, Volume. 12, Issue 5, 480(2004)

[in Chinese]

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[5] [5] HOGREFE H, GIESENBERG D, HAELBICH R P. A New VUV-reflectometer for UHV-applications[J].Nuclear Instruments and Methods, 1983,208:415-418.

[6] [6] MIHIRO Y. Soft x-ray reflection from SiC, TiC, and WC mirrors[J].Appl. Opt. ,1986,25(24):4586-4590.

[7] [7] FUCHSchs D. HIGH precision soft x-ray reklectmeter[J].Rev. Sci. Instrum ,1995,66(2):2248-2250.

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Optics and Precision Engineering, 2004, 12(5): 480

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Paper Information

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Received: Jul. 22, 2004

Accepted: --

Published Online: Nov. 3, 2006

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Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology