Chinese Physics B, Volume. 29, Issue 10, (2020)
Characterization of swift heavy ion tracks in MoS2 by transmission electron microscopy
Fig. 2. Plan-view TEM images of MoS2 after swift heavy ion irradiation with (a), (b) 129Xe 5×1012 ions/cm2, (c), (d) 181Ta 5×1010 ions/cm2, and (e), (f) 209Bi 5×1011 ions/cm2. The left and right rows are the phase contrast images obtained at under-focus and over-focus conditions, respectively.
Fig. 3. Statistical diameter distribution of ion tracks in irradiated MoS2 with different electronic energy losses. The average diameters of the ion tracks (
Fig. 4. TEM images of different ion track morphologies of MoS2 irradiated at 30° with 1785.7 MeV 181Ta ions. (a) Nearly cylindrical ion tracks consist of two spherical hillocks at each end. (b) Sandglass-like ion tracks. The apparent length in MoS2 sample is about 180 nm. (c) The q-tips-like ion tracks. The size of hillocks increases with increasing apparent length.
Fig. 5. Schematics of the formation process of ion track in irradiated MoS2 with SHIs. (a) SHIs bombardment. (b) Target material melting along the ion path. (c) Outflow of molten phase towards the free surface. (d) Recrystallization in ion damage zone.
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Li-Jun Xu, Peng-Fei Zhai, Sheng-Xia Zhang, Jian Zeng, Pei-Pei Hu, Zong-Zhen Li, Li Liu, You-Mei Sun, Jie Liu. Characterization of swift heavy ion tracks in MoS2 by transmission electron microscopy[J]. Chinese Physics B, 2020, 29(10):
Received: Apr. 27, 2020
Accepted: --
Published Online: Apr. 21, 2021
The Author Email: Zhai Peng-Fei (j.liu@impcas.ac.cn)