Chinese Physics B, Volume. 29, Issue 10, (2020)
Characterization of swift heavy ion tracks in MoS2 by transmission electron microscopy
The various morphologies of tracks in MoS2 irradiated by swift heavy ions at normal and 30° incidence with 9.5–25.0 MeV/u 86Kr, 129Xe, 181Ta, and 209Bi ions were investigated by transmission electron microscopy. The diameter of ion tracks increases from 1.9 nm to 4.5 nm with increasing electronic energy loss. The energy loss threshold of the track formation in MoS2 is predicted as about 9.7 keV/nm based on the thermal spike model and it seems consistent with the experimental results. It is shown that the morphology of ion tracks is related to the penetration length of ions in MoS2. The formation process of ion tracks is discussed based on the cooperative process of outflow and recrystallization of the molten phase during rapid quenching.
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Li-Jun Xu, Peng-Fei Zhai, Sheng-Xia Zhang, Jian Zeng, Pei-Pei Hu, Zong-Zhen Li, Li Liu, You-Mei Sun, Jie Liu. Characterization of swift heavy ion tracks in MoS2 by transmission electron microscopy[J]. Chinese Physics B, 2020, 29(10):
Received: Apr. 27, 2020
Accepted: --
Published Online: Apr. 21, 2021
The Author Email: Zhai Peng-Fei (j.liu@impcas.ac.cn)