Infrared and Laser Engineering, Volume. 52, Issue 8, 20230059(2023)
Depth range enhancement of three-dimensional profiling measurement technology based on dithering algorithms
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Jingwen Yang, Zonghua Zhang, Lina Fu, Yanling Li, Nan Gao, Feng Gao. Depth range enhancement of three-dimensional profiling measurement technology based on dithering algorithms[J]. Infrared and Laser Engineering, 2023, 52(8): 20230059
Category: Photoelectric measurement
Received: Jan. 20, 2023
Accepted: --
Published Online: Oct. 19, 2023
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