Infrared and Laser Engineering, Volume. 52, Issue 8, 20230059(2023)

Depth range enhancement of three-dimensional profiling measurement technology based on dithering algorithms

Jingwen Yang1, Zonghua Zhang1,2, Lina Fu1, Yanling Li1,2, Nan Gao1, and Feng Gao2
Author Affiliations
  • 1School of Mechanical Engineering, Hebei University of Technology, Tianjin 300130, China
  • 2Centre for Precision Technology, University of Huddersfield, Huddersfield HD13DH, UK
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    References(20)

    [12] [12] Floyd R W, Steinberg L. An adaptive algithm f spatial grayscale[C]Proc Soc Inf Disp, 1976, 17: 7577.

    [13] [13] Ulichney R A. Digital Halftoning[M]. Cambridge: MIT Press, 1987.

    [20] [20] Meng Sensen. Threedimensional shape measurement based on dithering technique[D]. Hangzhou: Zhejiang University, 2020. (in Chinese)

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    Jingwen Yang, Zonghua Zhang, Lina Fu, Yanling Li, Nan Gao, Feng Gao. Depth range enhancement of three-dimensional profiling measurement technology based on dithering algorithms[J]. Infrared and Laser Engineering, 2023, 52(8): 20230059

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    Paper Information

    Category: Photoelectric measurement

    Received: Jan. 20, 2023

    Accepted: --

    Published Online: Oct. 19, 2023

    The Author Email:

    DOI:10.3788/IRLA20230059

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