Optoelectronics Letters, Volume. 15, Issue 2, 147(2019)
International comparison of the SIAR measurement andthe WRR standard
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TANG Xiao, XIA Yun-zhi, FANG Wei, WANG Yu-peng, YE Xin. International comparison of the SIAR measurement andthe WRR standard[J]. Optoelectronics Letters, 2019, 15(2): 147
Received: Jul. 19, 2018
Accepted: Aug. 16, 2018
Published Online: Apr. 16, 2019
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