Optoelectronics Letters, Volume. 15, Issue 2, 147(2019)

International comparison of the SIAR measurement andthe WRR standard

Xiao TANG1... Yun-zhi XIA1, Wei FANG2,*, Yu-peng WANG2 and Xin YE2 |Show fewer author(s)
Author Affiliations
  • 1University of South China, Hengyang 421001, China
  • 2Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
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    TANG Xiao, XIA Yun-zhi, FANG Wei, WANG Yu-peng, YE Xin. International comparison of the SIAR measurement andthe WRR standard[J]. Optoelectronics Letters, 2019, 15(2): 147

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    Paper Information

    Received: Jul. 19, 2018

    Accepted: Aug. 16, 2018

    Published Online: Apr. 16, 2019

    The Author Email:

    DOI:10.1007/s11801-019-8117-2

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