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Laser & Optoelectronics Progress, Volume. 55, Issue 3, 031202(2018)

Local Sampling Ritchey-Common Test for Large Aperture Flat Mirror

Dongdong Lin1,2, Mingyong Hu1、*, Jinpeng Li1, and Yaofang Ding1
Author Affiliations
  • 1 Academy of Photoelectric Technology, Hefei University of Technology, Hefei, Anhui 230009, China
  • 1 CAS Nanjing Astronomical Instruments Co., Ltd, Nanjing, Jiangsu 210042, China
  • 1 University of Chinese Academy of Sciences, Beijing 100049, China
  • 2 Nanjing Research Centre of Astronomical Instruments, Chinese Academy of Sciences, Nanjing, Jiangsu 210042, China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (7)
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    Figures & Tables(7)
    Schematic diagram of Ritchey-Common test

    Fig. 1. Schematic diagram of Ritchey-Common test

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    Relationship between (a) mirror surface and (b) pupil coordinates

    Fig. 2. Relationship between (a) mirror surface and (b) pupil coordinates

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    Surface shape of simulation. (a) Initial surface shape of set plane; (b) recovery surface shape of local sampling impact matrix method

    Fig. 3. Surface shape of simulation. (a) Initial surface shape of set plane; (b) recovery surface shape of local sampling impact matrix method

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    Results of surface shape deviation. (a) Surface shape deviation of traditional impact matrix method; (b) surface shape deviation of local sampling impact matrix method

    Fig. 4. Results of surface shape deviation. (a) Surface shape deviation of traditional impact matrix method; (b) surface shape deviation of local sampling impact matrix method

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    Surface shape deviation of traditional impact matrix method in different aberrations. (a) Defocus; (b) 0° astigmatism; (c) 45 ° astigmatism; (d) three levels of coma in x direction; (e) three levels of coma in y direction; (f) three levels of astigmatism in x direction; (g) three levels of astigmatism in y direction; (h) three levels of spherical aberration

    Fig. 5. Surface shape deviation of traditional impact matrix method in different aberrations. (a) Defocus; (b) 0° astigmatism; (c) 45 ° astigmatism; (d) three levels of coma in x direction; (e) three levels of coma in y direction; (f) three levels of astigmatism in x direction; (g) three levels of astigmatism in y direction; (h) three levels of spherical aberration

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    Surface shape deviation of local sampling impact matrix method in different aberrations. (a) Defocus; (b) 0° astigmatism; (c) 45° astigmatism; (d) three levels of coma in x direction; (e) three levels of coma in y direction; (f) three levels of astigmatism in x direction; (g) three levels of astigmatism in y direction; (h) three levels of spherical aberration

    Fig. 6. Surface shape deviation of local sampling impact matrix method in different aberrations. (a) Defocus; (b) 0° astigmatism; (c) 45° astigmatism; (d) three levels of coma in x direction; (e) three levels of coma in y direction; (f) three levels of astigmatism in x direction; (g) three levels of astigmatism in y direction; (h) three levels of spherical aberration

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    • Table 1. Comparison of RMS values of two methods under different aberrationsλ

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      Table 1. Comparison of RMS values of two methods under different aberrationsλ

      MethodDefocus0°astigmatism45°astigmatismThree levelsof coma inx directionThree levelsof coma iny directionThree levels ofastigmatism in x directionThree levels ofastigmatism iny directionThree levelsof sphericalaberration
      Traditionalimpactmatrix0.05450.02730.01080.05390.02240.02030.01860.2436
      Localsamplingimpactmatrix0.04380.01370.00540.02090.00600.00540.00520.1344
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    Dongdong Lin, Mingyong Hu, Jinpeng Li, Yaofang Ding. Local Sampling Ritchey-Common Test for Large Aperture Flat Mirror[J]. Laser & Optoelectronics Progress, 2018, 55(3): 031202

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    Paper Information

    Category: Instrumentation, measurement, and metrology

    Received: Aug. 31, 2017

    Accepted: --

    Published Online: Sep. 10, 2018

    The Author Email: Hu Mingyong (humy8@126.com)

    DOI:10.3788/LOP55.031202

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology