[1] [1] Tho D Nguyen, Eitan Ehrenfreund, Z Valy Vardeny. Science, 2012, 337: 204.

[2] [2] Chen Yonghua, Chen Jiangshan, Ma Dongge, et al. Appl. Phys. Lett., 2011, 99: 103304.

[5] [5] Zhang Yingfang, Cheng Gang, Zhao Yi, et al. Appl. Phys. Lett., 2005, 86: 011112.

[6] [6] Se Hun Kim, Sanghyuk Park, Ji Eon Kwon, et al. Adv. Funct. Mater., 2011, 21: 644.

[7] [7] Kyoung Soo Yook, Soon Ok Jeon, Jun Yeob Lee. Thin Solid Films, 2010, 518: 5827.

[8] [8] Yan Shao, Yang Yang. Appl. Phys. Lett., 2005, 86: 073510.

[9] [9] Youngseo Park, Jaewook Kang, Dongmin Kang, et al. Adv. Mater., 2008, 20(10): 1957.

[10] [10] Wang Jun, Yu Junsheng, Li Lu, et al. J. Phys. D: Appl. Phys., 2008, 41: 045104.

[11] [11] Zhao Juan, Yu Junsheng, Liu Shengqiang, et al. J. Lumin., 2012, 132: 1994.

[12] [12] SangHyun Eom, Ying Zheng, Neetu Chopra, et al. Appl. Phys. Lett., 2008, 93: 133309.

[13] [13] Liu Shengqiang, Yu Junsheng, Ma Zhu, et al. J. Lumin., 2012, http://dx.doi.org/10.1016/j.jlumin.2012.07.012.

[15] [15] Holmes R J, DAndrade B W, Forrest S R. Appl. Phys. Lett., 2003, 83(18): 3818.

[16] [16] Soonnam Kwon, Kyung-Ryang Wee, Jeong Won Kim, et al. Appl. Phys. Lett., 2010, 97: 023309.

[17] [17] Zhao Juan, Yu Junsheng, Hu Xiao, et al. Thin Solid Films, 2012, 520: 4003.

[18] [18] Lee S S, Song T J, Cho S M. Materials Science and Engineering: B, 2002, 95(1): 24.

[19] [19] Burrows P E, Forrest S R. Appl. Phys. Lett., 1994, 64(17): 2285.