Electronics Optics & Control, Volume. 22, Issue 1, 97(2015)
A Multi-Factor Based Sample Allocation Scheme for Testability Verification of Electromechanical Equipment
References(1)
[2] [2] PATTIPATI K R,ALEXANDRIDIS M G.Application of heuristic search and information theory to sequential fault diagnosis［J］.IEEE Transactions on Systems,Man,and Cybernetics,1990,20(4)：872-887．
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HE Yang, LI Hong-tao, WANG Zhi-xin. A Multi-Factor Based Sample Allocation Scheme for Testability Verification of Electromechanical Equipment[J]. Electronics Optics & Control, 2015, 22(1): 97
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Received: Nov. 3, 2013
Accepted: --
Published Online: Jan. 13, 2015
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