Fig. 1. Infrared spectra of purified PAM, PAM-g-PAA, PAM-g-PHEA, and PAM-g-PAA/PHEA

Fig. 2. Surface tension of different aerosol fixatives

Fig. 3. SEM micrograph of (a) PAM, (b) PAM-g-PAA, (c) PAM-g-PHEA, (d) PAM-g-PAA/PHEA

Fig. 4. Cross-sectional scans of different aerosol fixatives after film formation: (a) PAM; (b) PAM-g-PAA; (c) PAM-g-PHEA; (d) PAM-g-PAA/PHEA

Fig. 5. Cross-sectional SEM images of solutions mixed with different aerosol fixatives and tellurium powder after film formation: (a) PAM; (b) PAM-g-PAA; (c) PAM-g-PHEA; (d) PAM-g-PAA/PHEA

Fig. 6. Digital pictures of the sedimentation variation d of tellurium powder in PAM-g-PAA/PHEA, PAM-g-PHEA, PAM-g-PAA and PAM solutions: (a) 0 h; (b) 6 h; (c) 12 h; (d) 24 h; (e) 36 h; (f) 48 h (color online)

Fig. 7. Variation of aerosol particle mass concentration in the simulated chamber with time

Fig. 8. Schematic of aerosol immobilization mechanism