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Optics and Precision Engineering, Volume. 14, Issue 5, 754(2006)

Elliptically bent crystal spectrometer for measuring laser-produced plasma X-ray

XIONG Xian-cai1... ZHONG Xian-xin2, XIAO Sha-li2 and ZHU Gang2 |Show fewer author(s)
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  • 2[in Chinese]
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    XIONG Xian-cai, ZHONG Xian-xin, XIAO Sha-li, ZHU Gang. Elliptically bent crystal spectrometer for measuring laser-produced plasma X-ray[J]. Optics and Precision Engineering, 2006, 14(5): 754

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    Paper Information

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    Received: Mar. 16, 2006

    Accepted: --

    Published Online: Feb. 28, 2010

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    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology