Chinese Optics Letters, Volume. 7, Issue 7, 07585(2009)

Experimental study on electrical resistivity measurement of a specimen at high temperature

Chunsuo Xin1,2, Jingmin Dai1, and Xiaowa He2
Author Affiliations
  • 1Department of Automation Measurement and Control, Harbin Institute of Technology, Harbin 150001, China
  • 2Aerospace Research Institute of Materials and Processing Technology, Beijing 100076, China
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    References(12)

    [1] [1] A. Cezairliyan, Int. J. Thermophys. 5, 177 (1984).

    [2] [2] D. D. L. Chung, J. Therm. Anal. Calorim. 65, 153 (2001).

    [3] [3] F. Righini, J. Spisiak, G. C. Bussolino, and F. Scarpa, High Temp. High Press. 29, 473 (1997).

    [4] [4] F. Righini, R. B. Roberts, A. Rosso, and P. C. Cresto, High Temp. High Press. 18, 561 (1986).

    [7] [7] H. W. Yoon, C. E. Gibson, V. Khromchenko, G. P. Eppeldauer, R. R. Bousquet, S. W. Brown, and K. R. Lykke, Int. J. Thermophys. 29, 285 (2008).

    [8] [8] C. Xin, J. Dai, and Y. Wang, Infrared Technol. (in Chinese) 30, 47 (2008).

    [9] [9] L. Liu, J. Wang, L. Xin, X. Jiang, and P. Li, Chin. J. Sci. Instrum. (in Chinese) 24, 547 (2003).

    [10] [10] C. Xin, J. Dai, X. He, and L. Huang, Laser and Infrared (in Chinese) 38, 219 (2008).

    [12] [12] F. Righini, R. B. Roberts, and A. Rosso, High Temp. High Press. 18, 573 (1986).

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    Chunsuo Xin, Jingmin Dai, Xiaowa He. Experimental study on electrical resistivity measurement of a specimen at high temperature[J]. Chinese Optics Letters, 2009, 7(7): 07585

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    Paper Information

    Received: Sep. 27, 2008

    Accepted: --

    Published Online: Jul. 24, 2009

    The Author Email:

    DOI:10.3788/COL20090707.0585

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