Chinese Optics Letters, Volume. 7, Issue 7, 07585(2009)
Experimental study on electrical resistivity measurement of a specimen at high temperature
A new technique is developed to measure the electrical resistivity of conductor with a nonuniform temperature profile. The calculation method is derived from the temperature dependence of the electrical resistivity. The apparatus consists mainly of a high temperature environmental chamber, a power circuit of heating, a twenty-wavelength pyrometer, and a scanning pyrometer. After getting the resistance from the voltage drop of the specimen, the electrical resistivity in a wide temperature range of the specimen can be obtained by our calculation model. Preliminary results of the electrical resistivity of SRM 8424 over a wide temperature range (1000-3000 K) are presented. The perfect consistency between the measurement results and the nominal values justifies the validity of this technique.
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Chunsuo Xin, Jingmin Dai, Xiaowa He. Experimental study on electrical resistivity measurement of a specimen at high temperature[J]. Chinese Optics Letters, 2009, 7(7): 07585
Received: Sep. 27, 2008
Accepted: --
Published Online: Jul. 24, 2009
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