Microelectronics, Volume. 53, Issue 3, 525(2023)
Study on Displacement Damage Effect in OP604 Phototransistor
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WAN Kai, GAO Jie, NIU Rui. Study on Displacement Damage Effect in OP604 Phototransistor[J]. Microelectronics, 2023, 53(3): 525
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Received: Dec. 29, 2022
Accepted: --
Published Online: Jan. 3, 2024
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