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Microelectronics, Volume. 53, Issue 3, 525(2023)

Study on Displacement Damage Effect in OP604 Phototransistor

WAN Kai1...2, GAO Jie3 and NIU Rui4 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
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    WAN Kai, GAO Jie, NIU Rui. Study on Displacement Damage Effect in OP604 Phototransistor[J]. Microelectronics, 2023, 53(3): 525

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    Received: Dec. 29, 2022

    Accepted: --

    Published Online: Jan. 3, 2024

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.220526

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology