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Laser & Optoelectronics Progress, Volume. 50, Issue 2, 21701(2013)

Sweep Light Source OCT Method for the Test of Textured Monocrystalline Silicon

Yu Haimin1、*, Niu Yuan1, Liu Guilin1, Meng Zhuo2,3, Yao Steve1,2,4, and Li Guohua1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4General Photonics Corporation, 5228 Edison Avenue, Chino, California 91710, USA
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    Yu Haimin, Niu Yuan, Liu Guilin, Meng Zhuo, Yao Steve, Li Guohua. Sweep Light Source OCT Method for the Test of Textured Monocrystalline Silicon[J]. Laser & Optoelectronics Progress, 2013, 50(2): 21701

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    Paper Information

    Category: Medical Optics and Biotechnology

    Received: Oct. 22, 2012

    Accepted: --

    Published Online: Jan. 5, 2013

    The Author Email: Haimin Yu (yuhaimin0608@163.com)

    DOI:10.3788/lop50.021701

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology