Infrared and Laser Engineering, Volume. 34, Issue 1, 15(2005)
Low vacuum annealing impact on current-voltage characterization of GaN MSM UV detectors
Get Citation
Copy Citation Text
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Low vacuum annealing impact on current-voltage characterization of GaN MSM UV detectors[J]. Infrared and Laser Engineering, 2005, 34(1): 15