Semiconductor Optoelectronics, Volume. 41, Issue 3, 379(2020)

Warpage Control and Correction of InP Wafer in Back-thinning Process

ZHANG Yuanyuan*... LIU Cong, ZHAO Wenbo, MO Caiping, DONG Xufeng, HUANG Yulan, LIANG Xingyu, DUAN Lihua, TIAN Kun and ZHANG Hongbo |Show fewer author(s)
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    ZHANG Yuanyuan, LIU Cong, ZHAO Wenbo, MO Caiping, DONG Xufeng, HUANG Yulan, LIANG Xingyu, DUAN Lihua, TIAN Kun, ZHANG Hongbo. Warpage Control and Correction of InP Wafer in Back-thinning Process[J]. Semiconductor Optoelectronics, 2020, 41(3): 379

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    Paper Information

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    Received: Jan. 16, 2020

    Accepted: --

    Published Online: Jun. 18, 2020

    The Author Email: Yuanyuan ZHANG (cqzl327@163.com)

    DOI:10.16818/j.issn1001-5868.2020.03.015

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