Researching | Absolute test technology for rotation and translation interference based on lightweight calibration mirror

Journal of Applied Optics, Volume. 44, Issue 1, 122(2023)

Absolute test technology for rotation and translation interference based on lightweight calibration mirror

Koukou DIWU... Zhishan GAO, Weijian LIU, Xiaoyu CHE, Yicen MA, Xiaoxin FAN and Qun YUAN* |Show fewer author(s)

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School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China

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Fig. 1. Schematic diagram of lightweight grid

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Fig. 2. Lightweight design simulation with three-point back support

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Fig. 3. Lightweight design simulation with six-point back support

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Fig. 4. SiC calibration mirror

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Fig. 5. Three typical surface shapes and medium-high frequency information

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Fig. 6. Simulation of rotation and translation method without support and gravity deformation

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Fig. 7. Simulation of rotation and translation method with support and gravity deformation

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Table 1. Comparison of lightweight grid theory analysis

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Table 1. Comparison of lightweight grid theory analysis

	三角形	六边形	圆形
单个网格空心面积 $A$	$\frac{\sqrt{3}}{4} D^{2}$	$\frac{\sqrt{3}}{2} D^{2}$	$\frac{π}{4} D^{2}$
空间栅格面积 $S$	$\frac{3 \sqrt{3}}{2} {(1 + α)}^{2} D^{2}$	$\frac{\sqrt{3}}{4} {(1 + α)}^{2} D^{2}$	$\frac{\sqrt{3}}{4} {(1 + α)}^{2} D^{2}$
筋的面积 $S_{R}$	$\frac{3 \sqrt{3}}{2} {(1 + α)}^{2} D^{2}$	$\frac{\sqrt{3}}{2} α D^{2} + \frac{\sqrt{3}}{4} α^{2} D^{2}$	$\frac{\sqrt{3}}{4} {(1 + α)}^{2} D^{2} - \frac{π}{8} D^{2}$
筋的分布率 $R$	$1 - \frac{1}{{(1 + α)}^{2}}$	$1 - \frac{1}{{(1 + α)}^{2}}$	$1 - \frac{π}{2 \sqrt{3}} \frac{1}{{(1 + α)}^{2}}$

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Koukou DIWU, Zhishan GAO, Weijian LIU, Xiaoyu CHE, Yicen MA, Xiaoxin FAN, Qun YUAN. Absolute test technology for rotation and translation interference based on lightweight calibration mirror[J]. Journal of Applied Optics, 2023, 44(1): 122

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Paper Information

Category: Research Articles

Received: Apr. 6, 2022

Accepted: --

Published Online: Feb. 22, 2023

The Author Email: YUAN Qun (yuanqun@njust.edu.cn)

DOI:10.5768/JAO202344.0103002

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology