Acta Photonica Sinica, Volume. 31, Issue 3, 308(2002)

THE X-RAY DIFFRACTION STUDY ON THE INTERFACE OF AlGaAs BUFFER LAYER AND GaAs ACTIVE LAYER OF THE TRANSPARENT GaAs PHOTOCATHODE

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. THE X-RAY DIFFRACTION STUDY ON THE INTERFACE OF AlGaAs BUFFER LAYER AND GaAs ACTIVE LAYER OF THE TRANSPARENT GaAs PHOTOCATHODE[J]. Acta Photonica Sinica, 2002, 31(3): 308

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    Paper Information

    Category: Optoelectronics

    Received: Jul. 5, 2001

    Accepted: --

    Published Online: Sep. 18, 2007

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