Journal of Applied Optics, Volume. 40, Issue 6, 1139(2019)
Review of microsphere optical microscopy for super-resolution imaging and metrology
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XU Wei, YUAN Qun, GAO Zhishan, YU Haobiao, SUN Yifeng, QU Yi. Review of microsphere optical microscopy for super-resolution imaging and metrology[J]. Journal of Applied Optics, 2019, 40(6): 1139
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Received: Jun. 19, 2019
Accepted: --
Published Online: Feb. 11, 2020
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