Acta Optica Sinica, Volume. 18, Issue 12, 1703(1998)

Study of Partical Coherent Imagery System in Microlithography

[in Chinese], [in Chinese], and [in Chinese]
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    References(6)

    [1] [1] J. Bokor, A. R. Neureuther, W. G. Oldham. Advanced lithography for ULSI. IEEE. Circuits & Devices, 1996, 43(1): 11~15

    [2] [2] H. H. Hopkins. On the diffraction theory of optical images. Proc. R. Soc., (London), 1953, A217(3): 408~432

    [3] [3] B. J. Thompson. Image formation with partially coherent light. In: E. Wolf, ed, Progressin Optics, 1969, 7: 169~230

    [4] [4] P. F. Luehrmann, P. VanOorschot et al.. 0.35 μm lithography using off-axis illumination. Optical Laser Microlithography VI, Proc. SPIE, 1993, 1927: 103~123

    [5] [5] N. Shiraishi, S. Hirukawa, Y. Takeuchi et al.. New imagingtechnique for 64 M-DRAM. Optical Laser Microlithography V, Proc. SPIE, 1992, 1674: 741~746

    [6] [6] Tohru Ogawa, Masaya Uematsu, Toshiyuki Ishimaru et al.. The effective light source optimization with the modified beam for the depth-of-focus enhancements. Optical Laser Microlithography VI, Proc. SPIE, 1994, 2197: 19~30

    CLP Journals

    [1] Zhao Yang, Gong Yan. Methods of Enhancing Uniformities of Output Beams from Beam Expanding Unit for Illumination System of Deep-Ultraviolet Lithography[J]. Acta Optica Sinica, 2012, 32(8): 822004

    [2] Zhao Yang, Gong Yan, Zhang Wei. Design of Beam Expanding Unit for Illumination System of DUV Lithography[J]. Acta Optica Sinica, 2011, 31(11): 1122004

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    [in Chinese], [in Chinese], [in Chinese]. Study of Partical Coherent Imagery System in Microlithography[J]. Acta Optica Sinica, 1998, 18(12): 1703

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Sep. 20, 1997

    Accepted: --

    Published Online: Oct. 18, 2006

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    DOI:

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