Infrared and Laser Engineering, Volume. 54, Issue 2, 20240289(2025)
Design of wide-band terahertz electric field strength measurement system based on cesium Rydberg atom
Figures & Tables(8)
Fig. 1. (a) The energy level diagram for Rydberg atom preparation; (b) EIT spectral signal
Fig. 2. THz transition frequency for
Fig. 3. The diagram for THz electric field strength measurement system
Fig. 4. The measured AT splitting signal at different value of THz electric field strength
Fig. 5. The relationship between measured AT splitting interval and square root of microwave power of input spread spectrum module
Fig. 6. The measured AT splitting signal at different value of THz electric field strength in different frequency
Table 1. Peak time of spectral signal and frequency interval of fine structure (laser sweep period 0.1 s)
View tableView in ArticleTable 1. Peak time of spectral signal and frequency interval of fine structure (laser sweep period 0.1 s)
Principal quantum number Voltage difference between different peaks/V Frequency difference between different peaks/MHz Voltage-to-frequency shift coefficient/ MHz·V−1·s−1 44 1.6576 903.1708 5448.666 45 1.5466 839.4970 5428.016 49 1.0880 596.9348 5486.533 Average 5454.404
Table 2. Coupling laser power at different wavelengths and corresponding Rabi frequency
View tableView in ArticleTable 2. Coupling laser power at different wavelengths and corresponding Rabi frequency
Wavelength/nm Power/mW Rabi frequency/MHz 512.87 17 2 $ \mathit{\pi }\times $ 511.79 33 2 $ \mathit{\pi }\times $ 512.04 44 2 $ \mathit{\pi }\times $ 511.07 25 2 $ \mathit{\pi }\times $ 512.34 33 2 $ \mathit{\pi }\times $ 510.97 20 2 $ \mathit{\pi }\times $ 511.14 20 2 $ \mathit{\pi }\times $ 511.34 20 2 $ \mathit{\pi }\times $ 511.78 17 2 $ \mathit{\pi }\times $
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Yingyun ZHANG, Jiwang CHAI, Guixiang LIU, Yang LIU, Shunli HAN. Design of wide-band terahertz electric field strength measurement system based on cesium Rydberg atom[J]. Infrared and Laser Engineering, 2025, 54(2): 20240289
Paper Information
Category: 光电测量
Received: Nov. 1, 2024
Accepted: Jan. 3, 2025
Published Online: Mar. 14, 2025
The Author Email: HAN Shunli (hsl@ei41.com)
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