Researching | Preparation and Characteristics of Middle and Far Infrared Stealth of Photonic Crystal Film under Intense Irradiation

Laser & Optoelectronics Progress, Volume. 56, Issue 3, 031601(2019)

Preparation and Characteristics of Middle and Far Infrared Stealth of Photonic Crystal Film under Intense Irradiation

Ruihuang Liu, Jiaming Shi^*, Dapeng Zhao, Jikui Zhang, and Zhiwei Liu

Author Affiliations

State Key Laboratory of Pulsed Power Laser Technology, National University of Defense Technology, Hefei, Anhui 230037, China

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References(14)

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[4] Zhang F Y, Zhou Y M, Sun Y Q et al. Preparation and characterization of Chitosan/Konjac glucomannan/CdS nanocomposite film with low infrared emissivity[J]. Materials Research Bulletin, 45, 859-862(2010). http://www.sciencedirect.com/science/article/pii/S002554081000070X

[5] Yu H J, Xu G Y, Shen X M et al. Effects of size, shape and floatage of Cu particles on the low infrared emissivity coatings[J]. Progress in Organic Coatings, 66, 161-166(2009). http://www.sciencedirect.com/science/article/pii/S0300944009001477

[6] Li Y B, Zhu H L, Zhang B Q et al. Research status and development trend of stealth coating[J]. Materials Review, 29, 358-360(2015).

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Ruihuang Liu, Jiaming Shi, Dapeng Zhao, Jikui Zhang, Zhiwei Liu. Preparation and Characteristics of Middle and Far Infrared Stealth of Photonic Crystal Film under Intense Irradiation[J]. Laser & Optoelectronics Progress, 2019, 56(3): 031601

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Paper Information

Category: Materials

Received: Aug. 2, 2018

Accepted: Aug. 31, 2018

Published Online: Jul. 31, 2019

The Author Email: Shi Jiaming (sjmeei@yahoo.com.cn)

DOI:10.3788/LOP56.031601

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology