Study On Optical Communications, Volume. 48, Issue 4, 73(2022)

Research on Test Method and Test System of WDM Device for 5G Fronthaul Network

Chun-lin HU*... Zi-ting GUAN and Chun YANG |Show fewer author(s)
Author Affiliations
  • WRI Testing Technologies Co., Ltd., Wuhan 430205, China
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    Figures & Tables(6)
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    • Table 1. [in Chinese]

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      Table 1. [in Chinese]

      通道标称中心波长/nm比对偏差=│手动测试数值-自动测试数值│
      中心波长/nm中心波长偏差/nm插入损耗最大值/dBAX/dBNX/dB
      112710.0120.0120.020.040.02
      212910.0080.0080.030.010.00
      313110.0040.0040.020.010.08
      413310.0130.0130.040.020.11
      513510.0010.0010.060.030.06
      613710.0230.0230.050.070.15
      偏差平均值0.0100.0100.040.030.07
      偏差最大值0.0230.0230.060.070.15
      偏差最小值0.0010.0010.020.010.00
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    Chun-lin HU, Zi-ting GUAN, Chun YANG. Research on Test Method and Test System of WDM Device for 5G Fronthaul Network[J]. Study On Optical Communications, 2022, 48(4): 73

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    Paper Information

    Category: Research Articles

    Received: Aug. 19, 2021

    Accepted: --

    Published Online: Aug. 5, 2022

    The Author Email: HU Chun-lin (clhu@wrilab.com)

    DOI:10.13756/j.gtxyj.2022.04.015

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