Infrared and Laser Engineering, Volume. 52, Issue 1, 20220278(2023)

Terahertz vector measurement system based on AlGaN/GaN HEMT terahertz mixer

Yiting Liu1,2,3, Qingfeng Ding2,3,4, Wei Feng1,2,3, Yifan Zhu1,2,3, Hua Qin1,2,3,4、*, Jiandong Sun1,2,3, and Kai Cheng5
Author Affiliations
  • 1School of Nano-Tech and Nano-Bionics, University of Science and Technology of China, Hefei 230026, China
  • 2Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou 215123, China
  • 3Jiangsu Provincial Key Laboratory of Nano Devices, Suzhou 215123, China
  • 4School of Physical Science and Technology, Shanghai Tech University, Shanghai 201210, China
  • 5Enkris Semiconductor, Inc., Suzhou 215000, China
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    Yiting Liu, Qingfeng Ding, Wei Feng, Yifan Zhu, Hua Qin, Jiandong Sun, Kai Cheng. Terahertz vector measurement system based on AlGaN/GaN HEMT terahertz mixer[J]. Infrared and Laser Engineering, 2023, 52(1): 20220278

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    Paper Information

    Category: Photoelectric measurement

    Received: Apr. 15, 2022

    Accepted: --

    Published Online: Feb. 9, 2023

    The Author Email: Hua Qin (hqin2007@sinano.ac.cn)

    DOI:10.3788/IRLA20220278

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