Infrared and Laser Engineering, Volume. 32, Issue 4, 416(2003)

Two different standards to characterize electro-optical imaging system performance

[in Chinese]*, [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    References(7)

    [1] [1] Scott L, J D'Agostino. NVEOD FLIR92 thermal imaging systems performance model[A]. SPIE Proceedings[C].1992, 1689.194-203.

    [2] [2] Driggers R G, Vollmerhausen R, Edwards T. The target identification performance of infrared imager models as a function of blur and sampling[A]. SPIE Processings[C].1999,3701.26-34. ]Bijl P, Valeton J M. TOD, a new method to characterize electro-optical system performance[A]. SPIE Proceedings[C].1998, 3377.182-193.

    [3] [3] Bijl P, Valeton J M. TOD, the alternative to MRTD and MRC[J]. Optical Engineering, 1998, 37(7): 1984-1994.

    [4] [4] Bijl P, Valeton J M.Validation of the new triangle orientation discrimination method and ACQUIRE model predictions using observer performance data for ship target[J]. Optical Engineering, 1998, 37(6): 1976-1985.

    [5] [5] Piet Bijl, Mathieu Valeton J, Arie N de Jong. TOD predicts target acquisition performance and canning thermal imagers[A]. SPIE Proceedings[C]. 2000, 4030.96-103.

    [6] [6] Dirk-Jan J de Lange, Mathieu Valeton J, Piet Bijl. Automatic characterization flectro-optical sensor with image-processing, using the triangle orientation discrimination (TOD) method[A]. SPIE Proceedings[C]. 2000,4030.104-111.

    [7] [7] Bijl P, Valeton J M. Guidelines for accurate TOD measurment[A]. SPIE[C]. 1999 ,3701.14-25.

    Tools

    Get Citation

    Copy Citation Text

    [in Chinese], [in Chinese], [in Chinese]. Two different standards to characterize electro-optical imaging system performance[J]. Infrared and Laser Engineering, 2003, 32(4): 416

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Oct. 8, 2002

    Accepted: Dec. 27, 2002

    Published Online: Apr. 28, 2006

    The Author Email:

    DOI:

    Topics