High Power Laser and Particle Beams, Volume. 36, Issue 10, 103005(2024)
Effect and mechanism of on-chip electrostatic discharge protection circuit under fast rising time electromagnetic pulse
Fig. 5. Internal temperature distribution of the device under negative pulse
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Xinyi Mao, Changchun Chai, Fuxing Li, Haodong Lin, Tianlong Zhao, Yintang Yang. Effect and mechanism of on-chip electrostatic discharge protection circuit under fast rising time electromagnetic pulse[J]. High Power Laser and Particle Beams, 2024, 36(10): 103005
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Received: Jul. 16, 2024
Accepted: Sep. 9, 2024
Published Online: Nov. 13, 2024
The Author Email: Li Fuxing (lifuxing2018@163.com)