Acta Photonica Sinica, Volume. 53, Issue 1, 0111001(2024)

Multi-wavelength Polarization Mirau Interference Microscope for Micro Profile Transient Measurement

Yuting GONG... Xin LYU, Wei LIU* and Ming KONG |Show fewer author(s)
Author Affiliations
  • College of Metrology and Measurement Engineering,China Jiliang University,Hangzhou 310018,China
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    Figures & Tables(10)
    Optical path of multi-wavelength polarization Mirau interference microscope for micro profile transient measurement
    Multi wavelength correction fringe order process
    Schematic pixel layout of color polarization camera
    Schematic of device prototype
    Measurement result of standard step
    Phase shift interferometric fringe patterns of R,G and B channels
    Microcosmic profile measurement results
    Surface roughness measurement results
    • Table 1. The microcosmic profile measurement results of diamond turning convex mirrors

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      Table 1. The microcosmic profile measurement results of diamond turning convex mirrors

      Measuremen resultPV/μmRMS/μm
      Wyko1.687 20.453 1
      Single wavelength Mirau3.597 60.270 8
      Dual-wavelength Mirau2.025 40.467 6
      Multi-wavelength Mirau2.013 30.458 3
    • Table 2. The surface roughness measurement results of diamond turning convex mirrors

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      Table 2. The surface roughness measurement results of diamond turning convex mirrors

      Measuremen resultPV/μmRMS/μmRa/μm
      Wyko0.302 90.021 00.015 2
      Multi-wavelength Mirau0.938 50.024 70.014 8
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    Yuting GONG, Xin LYU, Wei LIU, Ming KONG. Multi-wavelength Polarization Mirau Interference Microscope for Micro Profile Transient Measurement[J]. Acta Photonica Sinica, 2024, 53(1): 0111001

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    Paper Information

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    Received: Jun. 19, 2023

    Accepted: Aug. 24, 2023

    Published Online: Feb. 1, 2024

    The Author Email: LIU Wei (liuw@cjlu.edu.cn)

    DOI:10.3788/gzxb20245301.0111001

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