Annealing induced refinement on optical transmission and electrical resistivity of indium tin oxide

Wei-Lun Hsu; Cheng-Tao Lin; Tzu-Huan Cheng; Shih-Chiang Yen; Chee-Wee Liu; Din Ping; Gong-Ru Lin

doi:10.3788/COL20090703.0263

Chinese Optics Letters, Volume. 7, Issue 3, 03263(2009)

Annealing induced refinement on optical transmission and electrical resistivity of indium tin oxide

Wei-Lun Hsu, Cheng-Tao Lin, Tzu-Huan Cheng, Shih-Chiang Yen, Chee-Wee Liu, Din Ping, and Gong-Ru Lin

Institute of Photonics and Optoelectronics, and Department of Electrical Engineering, National Taiwan University, No.1 Roosevelt Road Sec.4, Taipei 1062 Department of Physics, National Taiwan University, No.1 Roosevelt Road Sec.4, Taipei 106

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Cited By

[1] H. Stroescu, M. Anastasescu, S. Preda, M. Nicolescu, M. Stoica, N. Stefan, V. Kampylafka, E. Aperathitis, M. Modreanu, M. Zaharescu, M. Gartner. Influence of thermal treatment in N2 atmosphere on chemical, microstructural and optical properties of indium tin oxide and nitrogen doped indium tin oxide rf-sputtered thin films. Thin Solid Films, 541, 121(2013).

[2] Chih-Hsien Cheng, Yung-Hsian Lin, Jung-Hung Chang, Chih-I. Wu, Gong-Ru Lin. Semi-transparent Si-rich SixC1?x p–i–n photovoltaic solar cell grown by hydrogen-free PECVD. RSC Advances, 4, 18397(2014).

[3] Andrea Capasso, Luigi Salamandra, Aldo Di Carlo, John Marcus Bell, Nunzio Motta. Low-temperature synthesis of carbon nanotubes on indium tin oxide electrodes for organic solar cells. Beilstein Journal of Nanotechnology, 3, 524(2012).

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Wei-Lun Hsu, Cheng-Tao Lin, Tzu-Huan Cheng, Shih-Chiang Yen, Chee-Wee Liu, Din Ping, Gong-Ru Lin. Annealing induced refinement on optical transmission and electrical resistivity of indium tin oxide[J]. Chinese Optics Letters, 2009, 7(3): 03263

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Paper Information

Received: Sep. 16, 2008

Accepted: --

Published Online: Mar. 20, 2009

The Author Email:

DOI:10.3788/COL20090703.0263

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology