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High Power Laser and Particle Beams, Volume. 32, Issue 4, 045001(2020)

Comparison of insulation properties of several liquid dielectrics under nanosecond pulses

Wei Jia1... Zhiqiang Chen1,2, Fan Guo1,2, Yaoyao Li1, Yuhang Qi1, Yongping Chen1 and Tian Yang1 |Show fewer author(s)
Author Affiliations
  • 1State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an 710024, China
  • 2State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an 710049, China
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    References(6)

    [1] Ba um, C E. Reminiscences of high-power electromagnetic[J]. IEEE Transactions on electromagnetic compatibility, 49, 211-218(2007).

    [4] Shi Lihua. An overview of the HEMP research in China[J]. IEEE Transactions on Electromagnetic Compatibility, 422-430(2013).

    [5] Wraight A, Prather W D. Developments in early-time (E1) high-altitude electromagnetic pulse(HEMP) test methods[J]. IEEE Transactions on Electromagnetic Compatibility, 55, 492-499(2013).

    [6] Giri D V, Prather W D. High-altitude electromagnetic pulse(HEMP) risetime evolution of technology and standards exclusive for E1 environment[J]. IEEE Transactions on Electromagnetic Compatibility, 55, 1-8(2013).

    [9] [9] Nyffeler M, Jaquier A, Reusser B, et al. VERIFY, a threat level NEMP simulat with a 1 ns risetime[C]America Electromagic. 2006.

    [14] [14] Martin T H, Guenther A H. J. C. Martin on pulsed power[M]. New Yk London: Plenum Press, 1996.

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    Wei Jia, Zhiqiang Chen, Fan Guo, Yaoyao Li, Yuhang Qi, Yongping Chen, Tian Yang. Comparison of insulation properties of several liquid dielectrics under nanosecond pulses[J]. High Power Laser and Particle Beams, 2020, 32(4): 045001

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    Paper Information

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    Received: Sep. 5, 2019

    Accepted: --

    Published Online: Mar. 30, 2020

    The Author Email:

    DOI:10.11884/HPLPB202032.190338

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology