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Optics and Precision Engineering, Volume. 11, Issue 6, 647(2003)

[in Chinese]

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    [1] [1] WANG Z P, SUN W M, RUAN S L, et al. Polarization-preserving totally reflecting prisms with a single medium layer[J]. Appl Opt, 1997, 36(13):2802-2806.

    [2] [2] COJOCARU E. Analytical relations for thin-film total internal reflection phase retarders[J]. Appl Opt, 1994, 33(31):7425-7430.

    [5] [5] Rabinovitch K. Polarization effects in optical thin films[J]. SPIE,1994,2253: 89-102.

    [6] [6] DEMCHENKO V A, KOROTAEV V V, PANKOV E V. Polarization properties of reflecting prisms and mirrors[J]. Sov J Opt Technol, 1993, 60(6):423-427.

    [7] [7] LIU J, AZZAM R M A. Polarization properties of corner-cube retroreflectors: theory and experiment[J]. Appl Opt, 1997,36(7):1553-1559.

    [8] [8] RABINOVITCH K. The application of thin films technique to compensate polarization effects on total internal reflection[J]. SPIE, 1998,1038:337-348.

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    [2] Wang Daodang, Yang Yongying, Chen Chen, Zhuo Yongmo. Calibration of Oblique-Reflection Aberration in Point-Diffraction Interferometer for High-Precision Spherical Surface Testing[J]. Acta Optica Sinica, 2011, 31(6): 612003

    [3] WU Jin-cai, HE Zhi-ping, SHU Rong, JIA Jian-jun, CHEN Shuang, WANG Jian-yu. Mechanism and Application of Phase Shift in the Polarized Optical Systems[J]. Acta Photonica Sinica, 2013, 42(1): 84

    [4] Li Zhaohui, Wang Zhao, Huang Junhui, Qi Jingya, Yu Bao, Guo Junjie. Design and Analysis of the Polarization-Preserving Films for Rectangular Prism[J]. Chinese Journal of Lasers, 2015, 42(3): 316002

    [5] WU Qian, LUO Jin, PAN Feng. Effects of posttreatments on optical properties and laser induced damage thresholds of HfO2 thin films[J]. Optics and Precision Engineering, 2016, 24(12): 3000

    [6] XUAN Bin, SONG Shu-mei. Influence of polarization direction orthogonality on precision of polarization phase shifting interferometry[J]. Optics and Precision Engineering, 2013, 21(12): 3001

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Optics and Precision Engineering, 2003, 11(6): 647

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    Paper Information

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    Received: Apr. 13, 2003

    Accepted: --

    Published Online: Nov. 3, 2006

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology