Acta Photonica Sinica, Volume. 51, Issue 6, 0612001(2022)

Sub-aperture Stitching Interferometry Based on Down-sampled Particle Swarm Optimization

Ruoyan WANG, Dan ZHU, Qun YUAN, Weijian LIU, and Zhishan GAO*
Author Affiliations
  • School of Electronic and Optical Engineering,Nanjing University of Science and Technology,Nanjing 210094,China
  • show less
    References(21)

    [2] KIM C J, WYANT J C. Subaperture test of a large flat or a fast aspheric surface[J]. Journal of the Optical Society of America, 71, 1587(1981).

    [5] PENG Shijun, MIAO Erlong. Sub-micron precision measurement of radius of curvature and uncertainties analysis[J]. Acta Optica Sinica, 34, 0512001(2014).

    [6] WANG Yuezhu, YI Tian, LI Hongyu et al. Sub-aperture stitching interference measurement method based on marker location and global optimization[J]. Opto-Electronic Engineering, 5, 83-87(2009).

    [12] LU Yunjun, TANG Feng, WANG Xiangzhao et al. Analysis on the accuracy of flat sub-aperture stitching interferometry[J]. Chinese Journal of Laser, 45, 0404002(2018).

    [17] GOLINI D, FORBES G, MURPHYP. Method for self-calibrated sub-aperture stitching for surface figure measurement[P].

    [18] LU Binghui, CHEN Fengdong, LIU Bingguo et al. Technology of sub-aperture stitching based on mapping image matching[J]. Infrared and Laser Engineering, 45, 0824005(2016).

    [19] CHEN Yiwei. Research on subaperture stitching testing method[D](2015).

    [20] KENNEDY J, EBERHART R. Particle swarm optimization[C], 4, 1942-1948(1995).

    [21] ZHU Feng. Research on the sub-aperture stitching testing technology for cylindrical lens[D](2019).

    Tools

    Get Citation

    Copy Citation Text

    Ruoyan WANG, Dan ZHU, Qun YUAN, Weijian LIU, Zhishan GAO. Sub-aperture Stitching Interferometry Based on Down-sampled Particle Swarm Optimization[J]. Acta Photonica Sinica, 2022, 51(6): 0612001

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 14, 2021

    Accepted: Mar. 17, 2022

    Published Online: Sep. 23, 2022

    The Author Email: Zhishan GAO (zhishgao@njust.edu.cn)

    DOI:10.3788/gzxb20225106.0612001

    Topics