Journal of Terahertz Science and Electronic Information Technology , Volume. 20, Issue 9, 877(2022)
Study on Single Event Upset of floating gate device
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JU Anan, GUO Hongxia, DING Lili, LIU Jiancheng, ZHANG Fengqi, ZHANG Hong, LIU Yitian, GU Chaoqiao, LIU Ye, FENG Yahui. Study on Single Event Upset of floating gate device[J]. Journal of Terahertz Science and Electronic Information Technology , 2022, 20(9): 877
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Received: Nov. 29, 2021
Accepted: --
Published Online: Oct. 28, 2022
The Author Email: Anan JU (AAJu@foxmail.com)