[1] [1] L. Tsang, J. A. Kong, R. T. Shin. Theory of Microwave Remote Sensing. New York: John Wiley & Sons, 1985. 84～193

[2] [2] F. T. Ulaby, R. K. Moore, A. K. Fung. Microwave Remote Sensing: Active and Passive. New York: Addison-Wesley, Reading, MA, Vol.II, 1982: 231～295

[3] [3] D. Winebrenner, A. Ishimaru. Application of the phase-perturbation technique to randomly rough surfaces. J. Opt. Soc. Am. (A), 1985, 12(2): 2285～2294

[4] [4] S. L. Broschat, E. I. Thorsos, A. Ishimaru. The phase perturbation techniquevs. an exact numerical method for random rough surface scattering. J. Electromagnetic Wavesand Applications, 1989, 3(3): 237～256

[5] [5] X. E. Han, Z. S. Wu, X. D. Zhang. Automated measment of scattering intensity. Proc. SPIE′s Annual Symposium on Optical Science, Engineering and Instrumentation, San Diego, USA, 1995, 7(2552): 531～537