Infrared and Laser Engineering, Volume. 44, Issue 1, 59(2015)

Technology of high precision test for laser spot based on double CCD detection in the outfield

Li Yanxiao1、*, Zhang Lei2, Zhang Honggang1, and Hu Leili1
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    Li Yanxiao, Zhang Lei, Zhang Honggang, Hu Leili. Technology of high precision test for laser spot based on double CCD detection in the outfield[J]. Infrared and Laser Engineering, 2015, 44(1): 59

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    Paper Information

    Category: 激光与光电子技术应用

    Received: May. 5, 2014

    Accepted: Jun. 15, 2014

    Published Online: Jan. 26, 2016

    The Author Email: Yanxiao Li (liyanxiao1234@163.com)

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