Acta Optica Sinica, Volume. 19, Issue 10, 1368(1999)

Influence of Characteristics of an AOM on the Measurement Accuracy of a Heterodyne Interferometer

[in Chinese], [in Chinese], and [in Chinese]
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    References(6)

    [1] [1] Sommargren G E. A new laser measurement system for precision metrology. Precision Engng, 1987, 9(4):179~184

    [2] [2] Zhao Yang, Li Dacheng. Research on non-contact measuring flatness of magnetic disk with optical heterodyne interferometer. Proc. SPIE, 1993, 2101:2101~1172

    [4] [4] Yariv A. Optical Electronics. New York: CBS College Publishing, 1985. 386

    [6] [6] Sapriel J. Acousto-Optics. New York: John Wiley & Sons, 1979. 57

    [7] [7] Yariv A. Optical Electronics. New York: CBS College Publishing, 1985. 395

    [8] [8] Xie Yu, Wu Yizun. Zeeman laser interferometer errors for high precision measurements. Appl. Opt., 1992, 31(7):881~884

    CLP Journals

    [1] SHANG Jian-hua, REN Li-hong, XU Hai-qin, ZHAO Shu-guang, HE Yan. Heterodyne Laser Doppler Vibrometer Based on Double Acousto-optic Frequency Shifters[J]. Acta Photonica Sinica, 2012, 41(10): 1149

    [2] ZHANG Wei-jing, SUN Yun-qiang. Phase Characteristics of the Collinear Heterodyne Interferometer System[J]. Acta Photonica Sinica, 2016, 45(4): 414003

    [3] Li Yang, Xiangli Bin, Zhang Wenxi, Huang Min, Wu Zhou, Kong Xinxin. Detection of Double Acousto-Optical Modulators Difference Frequency Based on Spectrum Correction[J]. Laser & Optoelectronics Progress, 2015, 52(5): 51205

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    [in Chinese], [in Chinese], [in Chinese]. Influence of Characteristics of an AOM on the Measurement Accuracy of a Heterodyne Interferometer[J]. Acta Optica Sinica, 1999, 19(10): 1368

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Oct. 9, 1997

    Accepted: --

    Published Online: Aug. 9, 2006

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